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Shanghai GaNova Electronic Information Co., Ltd.

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GaN Epitaxial Wafer

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SiC Epitaxial Wafer

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CVD Diamond Substrates

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Rapid Thermal Annealing System

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Hall Effect Sensor Tester

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Aluminum Nitride Wafer

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Laser Diode Chip

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Silicon Carbide Crystal

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Ga2O3 Wafer

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Silicon Wafer

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Sapphire Wafer

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Patterned Sapphire Substrates

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Wafer Holder

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Wafer Dicing Machine

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Shanghai GaNova Electronic Information Co., Ltd.
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Electronic Grade CVD Diamond Substrates Dielectric Constant 5.5
Electronic Grade CVD Diamond Substrates Dielectric Constant 5.5
  • Electronic Grade CVD Diamond Substrates Dielectric Constant 5.5
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Hole Mobility 3800 cm2/V·S Electronic Grade Single Crystal Diamond Dielectric Constant 5.5 3*3mm²*0.3mm Electronic Grade Single Crystal Diamond,N ...
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pcb dielectric dielectric strength of fr4 semiconductor test

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